Charge injection and trapping at perovskite interfaces with organic hole transporting materials of different ionization energies
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Charge injection and trapping at perovskite interfaces with organic hole transporting materials of different ionization energies

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Charge injection and trapping at perovskite interfaces with organic hole transporting materials of different ionization energies

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dc.contributor.author Droseros, Nikolaos
dc.contributor.author Dänekamp, Benedikt
dc.contributor.author Tsokkou, Demetra
dc.contributor.author Boix, Pablo P.
dc.contributor.author Banerji, Natalie
dc.date.accessioned 2020-03-06T15:18:31Z
dc.date.available 2020-03-06T15:18:31Z
dc.date.issued 2019
dc.identifier.uri https://hdl.handle.net/10550/73443
dc.description.abstract The extraction of photogenerated holes from CH3NH3PbI3 is crucial in perovskite solar cells. Understanding the main parameters that influence this process is essential to design materials and devices with improved efficiency. A series of vacuum deposited hole transporting materials (HTMs) of different ionization energies, used in efficient photovoltaic devices, are studied here by means of femtosecond transient absorption spectroscopy. We find that ultrafast charge injection from the perovskite into the different HTMs (<100 fs) competes with carrier thermalization and occurs independently of their ionization energy. Our results prove that injection takes place from hot states in the valence band making this efficient even for HTMs with higher ionization energy than that of the perovskite. Moreover, a new trapping mechanism is observed after the addition of HTMs, which is attributed to interfacial electron traps formed between the CH3NH3PbI3 and the HTMs, in addition to traps in the neat perovskite. Interfacial electron trapping is slower compared to the ultrafast hole injection, which contributes to the high efficiency obtained when these HTMs are employed in solar cells.
dc.language.iso eng
dc.relation.ispartof Apl Materials, 2019, vol. 7, p. 041115-1-041115-8
dc.rights.uri info:eu-repo/semantics/openAccess
dc.source Droseros, Nikolaos Dänekamp, Benedikt Tsokkou, Demetra Boix, Pablo P. Banerji, Natalie 2019 Charge injection and trapping at perovskite interfaces with organic hole transporting materials of different ionization energies Apl Materials 7 041115-1 041115-8
dc.subject Semiconductors
dc.subject Materials
dc.title Charge injection and trapping at perovskite interfaces with organic hole transporting materials of different ionization energies
dc.type info:eu-repo/semantics/article
dc.date.updated 2020-03-06T15:18:31Z
dc.identifier.doi https://doi.org/10.1063/1.5086692
dc.identifier.idgrec 136685

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