Photoluminescence Imaging and LBIC Characterization of Defects in mc-Si Solar Cells
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Photoluminescence Imaging and LBIC Characterization of Defects in mc-Si Solar Cells

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Photoluminescence Imaging and LBIC Characterization of Defects in mc-Si Solar Cells

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dc.contributor.author Sánchez Domínguez, Luis Alberto
dc.contributor.author Moretón, A.
dc.contributor.author Guada, M.
dc.contributor.author Rodríguez-Conde, S.
dc.contributor.author Martínez, O.
dc.contributor.author González, M.A.
dc.contributor.author Jiménez, J.
dc.date.accessioned 2019-05-22T13:22:05Z
dc.date.available 2019-05-22T13:22:05Z
dc.date.issued 2018
dc.identifier.uri https://hdl.handle.net/10550/70267
dc.description.abstract Today's photovoltaic market is dominated by multicrystalline silicon (mc-Si) based solar cells with around 70% of worldwide production. In order to improve the quality of the Si material, a proper characterization of the electrical activity in mc-Si solar cells is essential. A full-wafer characterization technique such as photoluminescence imaging (PLi) provides a fast inspection of the wafer defects, though at the expense of the spatial resolution. On the other hand, a study of the defects at a microscopic scale can be achieved through the light-beam induced current technique. The combination of these macroscopic and microscopic resolution techniques allows a detailed study of the electrical activity of defects in mc-Si solar cells. In this work, upgraded metallurgical-grade Si solar cells are studied using these two techniques.
dc.language.iso eng
dc.relation.ispartof Journal of Electronic Materials, 2018, vol. 47, num. 9, p. 5077-5082
dc.rights.uri info:eu-repo/semantics/openAccess
dc.source Sánchez Domínguez, Luis Alberto Moretón, A. Guada, M. Rodríguez-Conde, S. Martínez, O. González, M.A. Jiménez, J. 2018 Photoluminescence Imaging and LBIC Characterization of Defects in mc-Si Solar Cells Journal of Electronic Materials 47 9 5077 5082
dc.subject Ciència dels materials
dc.subject Semiconductors
dc.title Photoluminescence Imaging and LBIC Characterization of Defects in mc-Si Solar Cells
dc.type info:eu-repo/semantics/article
dc.date.updated 2019-05-22T13:22:05Z
dc.identifier.doi https://doi.org/10.1007/s11664-018-6381-8
dc.identifier.idgrec 131053

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