Millisecond radiative recombination in poly(phenylene vinylene)-based light-emitting diodes from transient electroluminescence
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Millisecond radiative recombination in poly(phenylene vinylene)-based light-emitting diodes from transient electroluminescence

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Millisecond radiative recombination in poly(phenylene vinylene)-based light-emitting diodes from transient electroluminescence

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dc.contributor.author García Belmonte, Germà
dc.contributor.author Montero, José M.
dc.contributor.author Barea, Eva M.
dc.contributor.author Bisquert, Juan
dc.contributor.author Bolink, Henk
dc.date.accessioned 2010-05-20T12:03:48Z
dc.date.available 2010-05-20T12:03:48Z
dc.date.issued 2007
dc.identifier.uri http://hdl.handle.net/10550/2454
dc.language.iso en en
dc.relation http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=JAPIAU000101000011114506000001&idtype=cvips&prog=normal&doi=10.1063/1.2743741 en
dc.source GARCÍA-BELMONTE, Germà ; MONTERO, José M. ; BAREA, Eva M. ; BISQUERT, Juan ; BOLINK, Henk J. Millisecond radiative recombination in poly(phenylene vinylene)-based light-emitting diodes from transient electroluminescence. En: Journal of Applied Physics, 2007, vol. 101 en
dc.subject Conducting polymers ; Organic light emitting diodes ; Electron-hole recombination ; Electroluminescence ; Minority carriers ; Electron traps ; Current density en
dc.title Millisecond radiative recombination in poly(phenylene vinylene)-based light-emitting diodes from transient electroluminescence en
dc.type info:eu-repo/semantics/article en
dc.type info:eu-repo/semantics/publishedVersion en
dc.subject.unesco UNESCO::FÍSICA en
dc.identifier.doi 10.1063/1.2743741 en
dc.description.abstractenglish The current and electroluminescence transient responses of standard poly(phenylene vinylene)-based light-emitting devices have been investigated. The electroluminescence time response is longer (milliseconds scale) than the current switch-off time by more than one order of magnitude, in the case of small area devices (<0.1 cm2). For large area devices ( ∼ 6 cm2) the electroluminescence decay time decreases from 1.45 ms to  ∼ 100 μs with increasing bias voltage. The fast current decay limits the electroluminescence decay at higher voltages. Several approaches are discussed to interpret the observed slow decrease of electroluminescence after turning off the bias. One relies upon the Langevin-type bimolecular recombination kinetics which is governed by the minority carriers (electrons), and another focuses on the slow release of trapped electrons as possible explanations. Additionally, we show that the device current density is mainly determined by the transport of the fastest carriers (holes). en
dc.description.private Henk.Bolink@uv.es en

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