Direct assessment of p-n junctions in single GaN nanowires by Kelvin probe force microscopy
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Direct assessment of p-n junctions in single GaN nanowires by Kelvin probe force microscopy

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Direct assessment of p-n junctions in single GaN nanowires by Kelvin probe force microscopy

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Minj, Albert; Cros Stotter, Ana; Auzelle, Thomas; Pernot, Julien; Daudin, Bruno
This document is a artículoDate2016

Este documento está disponible también en : http://hdl.handle.net/10550/57848

    Minj, Albert Cros Stotter, Ana Auzelle, Thomas Pernot, Julien Daudin, Bruno 2016 Direct assessment of p-n junctions in single GaN nanowires by Kelvin probe force microscopy Nanotechnology 27 38 385202
https://doi.org/10.1088/0957-4484/27/38/385202

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