Structural characterization of a-plane Zn1−xCdxO (0 < x <0.085) thin films grown by metal-organic vapor phase epitaxy.
NAGIOS: RODERIC FUNCIONANDO

Structural characterization of a-plane Zn1−xCdxO (0 < x <0.085) thin films grown by metal-organic vapor phase epitaxy.

DSpace Repository

Structural characterization of a-plane Zn1−xCdxO (0 < x <0.085) thin films grown by metal-organic vapor phase epitaxy.

Show full item record

View       (624.2Kb)

    
Zúñiga Pérez, Jesús; Muñoz Sanjosé, Vicente; Lorenz, M.; Benndorf, G.; Heitsch, S.; Spemann, D.; Grundmann, M.
This document is a artículo publicadoDate2006

Este documento está disponible también en : http://hdl.handle.net/10550/11216

    ZÚÑIGA-PÉREZ, J. ; MUÑOZ-SANJOSÉ, V. ; LORENZ, M. ; BENNDORF, G. ; HEITSCH, S. ; SPEMANN, D. ; GRUNDMANN, M. Structural characterization of a-plane Zn1−xCdxO (0 < x < 0.085) thin films grown by metal-organic vapor phase epitaxy. En: Journal of Applied Physics, 2006, vol. 99

This item appears in the following Collection(s)

Show full item record

Search DSpace

Advanced Search

Browse

Statistics